Latest news
Our paper on the use of the t-statistic in probability plots has appeared in Acta Crystallographica section A in July 2009. See the bibliography for details and a reprint.
Absolute structure determination
Since J.M. Bijvoet discovered that X-ray crystallography could be used to
determine the absolute structure of molecules, this technique has been refined
many times.
Our quest for absolute structures of C/H/N/O crystals
This site concentrates on the discussion about a method described by
Rob Hooft, Leo Straver and Anthony Spek that has been published
in the Journal of Applied Crystallography in February 2008: J. Appl. Cryst. (2008). 41, 96-103 (pdf).
This method gives a more reliable calculation of the absolute structure than
other existing methods. Imagine: you can finally determine the absolute
structure for a structure containing no atoms heavier than oxygen. Without resorting to exceptional data collection techniques.
It is easy with CuKa, but in good cases it can be done even using a MoKa data set.
You do not only get a qualitative assignment of the absolute structure, but also
a quantitative estimate of the reliability of that assignment. The paper uses a
combination of maximum likelihood estimation and Bayesian statistics
to calculate:
- A value y, comparable to the value of the Flack x parameter,
with its standard deviation. This does not assume any prior knowledge about
the compound.
- A pair of values P2(right) and P2(wrong) expressing the likelihood that
the given absolute structure is right or wrong, assuming the prior knowledge
that the compound is enantiopure.
- A triplet of values P3(right), P3(twin) and P3(wrong) expressing the likelihood
that the given absolute structure is right, that the crystal is a 50%/50% inversion twin,
or that the absolute structure should be inverted. This assumes the prior knowledge
that the crystal can not be an inversion twin with another ratio.
The method has been implemented in PLATON.
Further reading
Questions or suggestions
If you have any questions on the method or its application, or any suggestion
regarding the content of these web pages, feel free to contact us via E-mail.
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